Science Photonics Fair TOP / Japanese / Optronics

Highlights


National Institute of Advanced Industrial Science and Technology

Optical Thin Film Fair No. A-16
  2266-98 Anagahora shimoshidami moriyama-ku nagoya-city Aichi JAPAN.
  URL:http://www.aist.go.jp/
 

  ● Contact
   
    PHONE:052-736-7427 FAX:052-736-7406
 

  ● Highlights

With the recent advances in surface treatment and modification technology, the quantitative evaluation method for the surface properties has become increasingly important. The novel instrumented indentation microscope which developed by AIST is now possible to analyze both monolithic and film/substrate composite materials. Using indentation microscope, various mechanical parameters such as contact hardness, Young\'s modulus, creep characteristics, etc. are determined directly as well as quantitatively, compared to the prior methods. In addition, since the novel technique enables researchers to observe the plastic deformation and the fracture behavior in situ under contact stress condition, it contributes to understanding the new physical characterization.
 

 ● Products
   
Opto Micro Probe Direct Indentor

The novel instrumented indentation microscope which developed by AIST is now possible to analyze both monolithic and film/substrate composite materials.
Using indentation microscope, various mechanical parameters such as contact hardness, Young\'s modulus, creep characteristics, etc. are determined directly as well as quantitatively, compared to the prior methods.
 

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Overseas manufacturers distributed by exhibitors (2015)

3D SYSTEMS Inc.
4D Technology Corporation
  Lika Electronic
LIMO Lissotschenko Microoptik GmbH